AFM calibration standard, step height 20nm, mounted consumables Extended tip
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AFM calibration standard, step height 20nm, mounted consumables Extended tipThe HS series calibration standards offers an easy and reliable way to calibrate AFM systems. Primarily designed for accurate Z axis calibration the standards also offer X and Y axis calibration for bigger scanners in the 40 100m range. The structure symmetry enables calibration without the need to rotate and re align the sample in between x and Y axis calibration. The HS series feature silicon dioxide structure arrays on a 5x5mm silicon chip. The
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